Title:
SURFACE FLAW DETECTING METHOD
Document Type and Number:
Japanese Patent JP2001242089
Kind Code:
A
Abstract:
To provide a surface flaw detecting method stably detecting a surface flaw with good detectability even in a hot rolling process.
When light is radiated from a light projector 5 to a steel plate 1 positioned in the closest position to a final stand roll 2 of a finishing rolling machine, its reflected light is received by means of a line sensor camera 6 for image processing, and the surface flaw is detected. When a scale is formed on the steel plate 1, the scale becomes noise or covers the surface of the surface flaw and lowers flaw detection ability. Therefore, surface flaw detection is carried out while the scale is scarcely formed.
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Inventors:
KAZAMA AKIRA
MAYAHARA TAKASHI
KUSHIDA YASUO
MAYAHARA TAKASHI
KUSHIDA YASUO
Application Number:
JP2000050420A
Publication Date:
September 07, 2001
Filing Date:
February 28, 2000
Export Citation:
Assignee:
NIPPON KOKAN KK
International Classes:
G01B11/30; B21C51/00; G01N21/892; (IPC1-7): G01N21/892; B21C51/00; G01B11/30
Attorney, Agent or Firm:
Toshiaki Hosoe
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