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Patent Searching and Data


Title:
SURFACE FLAW INSPECTION MECHANISM
Document Type and Number:
Japanese Patent JPS5879145
Kind Code:
A
Abstract:

PURPOSE: To make appropriate the identification of outputted wave shape from different defect sections and obtain effective and exact inspection results based on the classification of the kinds of flaws by using flaw detection pulse signals and carrying out analog wave shape judgement.

CONSTITUTION: The surface of a moving object to be inspected such as a moving steel plate is scanned in the direction transverse to the movement and a defective part on a scanning line is detected by an optical means 1. The output of a light-receiving element in the optical means 1 is supplied by division to a differential amplification circuit 2 and a non-differential analog delay circuit 5. The output of the circuit 5 is outputted for a certain time by means of the defect inspection pulse that is the output of the circuit 2, and the inspection output is obtained through each of circuits 8 and 8a that judges the polarity and pulse width of defective output wave shapes.


Inventors:
FUJITA MASAKAZU
KITSUKA HIDEO
FURUKAWA YUKIO
MASUNO YASUHIKO
AKUTSU SHIYOUJI
Application Number:
JP17641081A
Publication Date:
May 12, 1983
Filing Date:
November 05, 1981
Export Citation:
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Assignee:
TOEI DENSHI KOGYO KK
KAWASAKI STEEL CO
International Classes:
G01N21/88; G01N21/89; G01N21/892; (IPC1-7): G01N21/89
Attorney, Agent or Firm:
Ichiichi Shirakawa