Surface plasmon resonance fluorescence analysis method, surface plasmon resonance fluorescence analyzer and surface plasmon resonance fluorescence analysis system

Japanese Patent JP6350541

B2

[Problem] To provide a surface plasmon resonance fluorescence analysis method, a surface plasmon resonance fluorescence analysis device, and a surface plasmon resonance fluorescence analysis system that can shorten as much as possible the time needed for examination in a case where a plurality of test chips are examined, that do not require the device to be made large, and that can inexpensively perform examination. [Solution] In the present invention, when examining a plurality of test chips, test chips are inserted into a plurality of test chip insertion openings of a fluorescence analysis device in which the insertion openings are formed, and firstly an initial measurement step for a first test chip is performed, and thereafter an initial measurement step for a second test chip is performed so that if multiple examinations are performed, an optical system is effectively utilized. A test chip for which the initial measurement step has been completed is sequentially subjected to a primary reaction step, a secondary reaction step, and a signal measurement step after the initial measurement step has been completed. By carrying out examination in such a sequence, it is possible to reduce examination time.

Koji Miyazaki
Masao Matsuo
Tetsuya Noda

JP2015544999A

July 04, 2018

October 28, 2014

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Konica Minolta Co., Ltd.

G01N21/64

JP2011112410A
JP2003139687A
JP2012026739A
JP2005315758A
JP2009103641A

WO2012108323A1

Patent corporation ssinpat

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