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Title:
SURFACE RESISTANCE VALUE MEASURING AND RECORDING APPARATUS OF ELECTROMAGNETIC WAVE SHIELD MOLDED PRODUCT
Document Type and Number:
Japanese Patent JPS60178369
Kind Code:
A
Abstract:

PURPOSE: To eliminate the irregularity due to a measuring condition by automating measurement, by determining the position of electromagnetic wave shield molded product at a measuring position and measuring and recording the surface resistance between electrodes while allowing an electrode unit having a pair of measuring electrodes to advance to and retract from the measuring position.

CONSTITUTION: A electromagnetic wave shield molded product 3 is settable to a measuring position by the movable bed 4 on an operation board 1 and three sets of electromagnetic units 8 are attached to the support member 7 provided to the leading end of the piston of the main cylinder 6 fixed to the support 5 on said board 1 by an electromagnetic chuck 8a while a sub-cylinder 8c enabling the falling an opposed electrode 8b is attached to the chuck 8a by a position adjusting member 8d to constituted a unit 8. Further, measuring electrodes are fixed to an insulating base board at constant intervals to constitute the electrode 8b and brought into contact with the surface of the molded product 3 at the measuring position by the cylinders 6, 8c and the surface resistance value thereof is measured and recorded.


Inventors:
SHIMIZU HIDETAKA
KOSUGI SOUJI
Application Number:
JP3360984A
Publication Date:
September 12, 1985
Filing Date:
February 24, 1984
Export Citation:
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Assignee:
TOSHIBA CHEM PROD
International Classes:
G01R27/02; (IPC1-7): G01R27/02
Domestic Patent References:
JP54040182B
JPS462948A
Attorney, Agent or Firm:
Suyama Saichi



 
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