Title:
SURFACE TENSION MEASUREMENT APPARATUS, SURFACE TENSION MEASUREMENT METHOD, CRITICAL MICELLE CONCENTRATION MEASUREMENT APPARATUS, AND CRITICAL MICELLE CONCENTRATION MEASUREMENT METHOD
Document Type and Number:
Japanese Patent JP2014202579
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a surface tension measurement apparatus configured to easily measure dynamic surface tension by means of a pendant drop method, and a surface tension measurement method, a critical micelle concentration measurement apparatus, and a critical micelle concentration measurement method.SOLUTION: A control apparatus 110 of a surface tension measurement apparatus includes: an initial droplet forming means 113 which causes a discharge device to discharge a liquid sample 2 in a predetermined initial amount of droplet which hangs from a tip of a needle; and a correction droplet forming means 114 which, every time a droplet drops from the tip of the needle, causes a discharge device to discharge the liquid sample in a corrected amount of droplet, the amount being less than the droplet which dropped from the discharge device, which hangs from the tip of the needle. A image processing apparatus 120 includes: a droplet image acquisition means 122 which acquires an image of droplet at multiple points of time; and a surface tension deriving means 123 which derives surface tension for each of the droplet images obtained at multiple points of time.
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Inventors:
KAMEI SHINICHI
Application Number:
JP2013078341A
Publication Date:
October 27, 2014
Filing Date:
April 04, 2013
Export Citation:
Assignee:
KYOWA INTERFACE SCIENCE CO LTD
International Classes:
G01N13/02
Attorney, Agent or Firm:
Sawara Masafumi
Yokota Kazuki
Yokota Kazuki
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