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Title:
SYSTEM ALLOWING SHEAR BOX TO FREELY ROTATE IN SHEARING PROCESS OF SINGLE SHEAR TEST
Document Type and Number:
Japanese Patent JP2006125949
Kind Code:
A
Abstract:

To make an undisturbingly-taken slide plane coincide with an under-test shear plane and to cause luster of an actual slide plane and friction marks to be satisfactorily maintained on a post-test shear plane, as to a shear testing apparatus with a shear box freely rotated in a shearing process of a single shear test, that is, shear strength measurement on weak surfaces such as a slide plane of a landslide, in particular.

This shear testing apparatus is characterized in that the shear box is structured so that it can freely make a horizontal turn in order that shear displacement advances with a minimum shear stress in the shearing process of the single shear test.


Inventors:
YAMAZAKI TAKASHIGE
SHIBAZAKI TATSUYA
MAYUMI TAKAYUKI
Application Number:
JP2004313171A
Publication Date:
May 18, 2006
Filing Date:
October 27, 2004
Export Citation:
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Assignee:
JAPAN CONSERVATION ENGINEERS C
International Classes:
G01N3/24; E02D1/04
Attorney, Agent or Firm:
Masao Isono