Title:
SYSTEM AND METHOD FOR INSPECTING PIEZOELECTRIC OSCILLATOR
Document Type and Number:
Japanese Patent JP3731551
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To obtain a system and a method for inspecting a piezoelectric oscillator, where a DIP phenomenon can be judged correctly and precisely, and the waiting time for stabilizing a temperature is eliminated.
SOLUTION: The inspection system is provided with a continuous temperature regulator 3 which generates a gas at a designated temperature, a specimen- housing box 5 in which a plurality of quartz oscillators are housed under a measurement temperature condition created by a gas ventilated by a gas blower 4, a temperature detection part 6 which measures and outputs temperatures around the quartz oscillators, a frequency measuring part 7 which measures and outputs frequencies of the quartz oscillators at a measuring temperature and a control part 20, which judges the quality of the quartz oscillators, on the basis of frequency deviation found by the inclination of frequency deviation obtained, on the basis of the measured frequency.
Inventors:
Hiroshi Kinoshita
Serizawa Satoshi
Serizawa Satoshi
Application Number:
JP2002059579A
Publication Date:
January 05, 2006
Filing Date:
March 05, 2002
Export Citation:
Assignee:
Seiko Epson Corporation
International Classes:
G01R29/22; G01N17/00; G01R31/00; H03B5/32; (IPC1-7): G01R29/22; H03B5/32
Domestic Patent References:
| JP9304448A | ||||
| JP64048682U |
Attorney, Agent or Firm:
Masahiko Ueyanagi
Fujitsuna Hideyoshi
Osamu Suzawa
Fujitsuna Hideyoshi
Osamu Suzawa
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