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Title:
SYSTEM, METHOD, AND MATERIAL PRODUCTION FOR DETERMINING FREQUENCY VALUES ASSOCIATED WITH FORCE APPLIED TO INSTRUMENTS
Document Type and Number:
Japanese Patent JP2005326399
Kind Code:
A
Abstract:

To provide a method for determining frequency values associated with force applied to an instrument.

This method contains a step (64) of calculating a plurality of 1st spectrum amplitudes, associated with 1st forced waveform applied to the instrument; a step (84) for calculating a plurality of 2nd spectrum amplitudes, associated with 2nd forced waveform applied to the instrument; steps (78, 98) of calculating the maximum spectrum amplitude, based on these plural 1st and 2nd spectrum amplitudes; a step (102) of determining amplitude threshold based on the maximum spectrum amplitude and the acceptable values; a step (104) of determining a plurality of 1st target frequency values, by selecting the frequency values associated with the subset of the 1st plural spectral amplitudes equal to or greater than the amplitude threshold; and a step (106) for determining a plurality of 2nd target frequency values by selecting frequency values, associated with the subset of the 2nd plural spectrum amplitudes equal to or greater than the amplitude threshold.


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Inventors:
Hatch, Charles T.
Application Number:
JP2005000056751
Publication Date:
November 24, 2005
Filing Date:
March 02, 2005
Export Citation:
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Assignee:
GENERAL ELECTRIC CO
International Classes:
G01H3/08; G01L23/00; G01M7/02; G01M15/00; G01R23/00; G05B15/02; G05B19/05; G05D16/20; G06F17/00; G10L11/04; G01H3/00; G01L23/00; G01M7/00; G01M15/00; G01R23/00; G05B15/02; G05B19/05; G05D16/20; G06F17/00; G10L11/00; (IPC1-7): G01H3/08