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Patent Searching and Data


Title:
SYSTEM AND METHOD FOR SUPPORTING FEM ANALYSIS
Document Type and Number:
Japanese Patent JP2001331534
Kind Code:
A
Abstract:

To provide an FEM analysis support system which can speedily obtain an FEM analysis model and an analysis result.

The FEM analysis support system which assists in providing the FEM analysis model and analysis result for a user in a short time through a computer network has a user terminal, an analysis control terminal and an analysis maker terminal, and the analysis control terminal has a database having information on analysis machine idle states of respective analysis makers, a retrieving means which instantaneously select an optimum analysis maker by retrieving information in the database, and a dividing means which divides order information regarding FEM analysis in ordering information according to the suitability of each analysis maker based on information regarding the analysis makers when the plural analysis makers are selected.


Inventors:
HIRATA ICHIRO
Application Number:
JP2000148754A
Publication Date:
November 30, 2001
Filing Date:
May 19, 2000
Export Citation:
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Assignee:
NEC CORP
International Classes:
G06F17/50; G06Q50/00; G06Q50/10; (IPC1-7): G06F17/50; G06F17/60
Attorney, Agent or Firm:
Asato Kato