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Patent Searching and Data


Title:
SYSTEM RESET CIRCUIT AND TESTING METHOD
Document Type and Number:
Japanese Patent JP2001005685
Kind Code:
A
Abstract:

To make suitably executable a circuit test without increasing the number of terminals.

The system reset circuit is provided with a 1st voltage comparator 1 for deriving a prescribed output when power supply voltage reaches a 1st prescribed value, an oscillation circuit 2 for receiving the output of the comparator 1 and impressing prescribed frequency to a frequency division circuit 3 and a 2nd voltage comparator 4 for deriving a prescribed output when the power supply voltage reaches 2nd prescribed value larger than the 1st prescribed value. An output is derived from an output terminal T3 after the lapse of a prescribed time from the arrival of the power supply voltage at the 1st prescribed value on the basis of an output from the circuit 3 and the output of the comparator 4 is impressed to the circuit 3 so that a mode is moved to a test mode when the power supply voltage arrives at the 2nd prescribed value larger than the 1st prescribed value.


Inventors:
SATO TADANOBU
Application Number:
JP17347399A
Publication Date:
January 12, 2001
Filing Date:
June 21, 1999
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
G01R31/3185; G06F1/24; G06F11/22; G01R31/28; (IPC1-7): G06F11/22; G01R31/3185; G01R31/28; G06F1/24
Attorney, Agent or Firm:
Kaneo Miyata (2 outside)