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Patent Searching and Data


Title:
MEASURING/PACKAGING/INSPECTING SYSTEM
Document Type and Number:
Japanese Patent JP2006256670
Kind Code:
A
Abstract:

To provide a measuring/packaging/inspecting system capable automatically checking whether all inspecting devices and the entire system are properly functioning (whether they are not malfunctioning, making mistakes in reservation or setting, etc).

The measuring/packaging/inspecting system includes a measuring device 1 for measuring goods and discharging a predetermined weight of goods, a packaging device 200 for receiving and packaging the goods discharged from the measuring device 1, and one or more inspecting devices, 300, 400 and 500, for inspecting products obtained by measuring and packaging operations. This system is provided with a defective production mode in which defective products are deliberately produced by the measuring device 1 and packaging device 200.


Inventors:
YOKOTA SUKETSUGU
Application Number:
JP2005078516A
Publication Date:
September 28, 2006
Filing Date:
March 18, 2005
Export Citation:
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Assignee:
ISHIDA SEISAKUSHO
International Classes:
B65B57/00; G01G23/01; G01V7/00
Domestic Patent References:
JPH09301327A1997-11-25
JP2001287707A2001-10-16
JPH04338520A1992-11-25
JP2005049300A2005-02-24
JP2002031567A2002-01-31
JP2004113995A2004-04-15
JP2003011926A2003-01-15
Attorney, Agent or Firm:
Yoshinobu Yamamura