Title:
ビジョンベース検査システムの光学構成要素の自律診断検証のためのシステム、方法、および装置
Document Type and Number:
Japanese Patent JP7223840
Kind Code:
B2
Abstract:
Methods of autonomous diagnostic verification and detection of defects in the optical components of a vision-based inspection system are provided. The method includes illuminating a light panel with a first light intensity pattern, capturing a first image of the first light intensity pattern with a sensor, illuminating the light panel with a second light intensity pattern different than the first light intensity pattern, capturing a second image of the second light intensity pattern with the sensor, comparing the first image and the second image to generate a comparison of images, and identifying defects in the light panel or the sensor based upon the comparison of images. Systems adapted to carry out the methods are provided as are other aspects.
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Inventors:
Yao-Jen Chan
Benjamin S. Pollack
Rajendra Prasad Naram Venkat
Venkatesh Narasim Ham Lucy
Benjamin S. Pollack
Rajendra Prasad Naram Venkat
Venkatesh Narasim Ham Lucy
Application Number:
JP2021515501A
Publication Date:
February 16, 2023
Filing Date:
September 19, 2019
Export Citation:
Assignee:
Siemens Healthcare Diagnostics Incorporated
International Classes:
G01N21/88; G01M11/00; G06V10/141; G06V10/60; G06V10/75
Domestic Patent References:
| JP2008032653A | ||||
| JP5302898A | ||||
| JP8068617A | ||||
| JP2016224707A |
Foreign References:
| US20130271755 |
Attorney, Agent or Firm:
Junji Yuda
Noriyuki Takebayashi
Noriyuki Takebayashi