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Title:
三次元コンポーネントの付加製造における製造精度を監視するシステム及び方法
Document Type and Number:
Japanese Patent JP7160928
Kind Code:
B2
Abstract:
A system for monitoring manufacturing precision in the additive manufacturing of three-dimensional components. A combined illuminations and detection element is provided equipped with a two-dimensional detector array and at least one laser radiation source directed onto a region of a material in powder or paste form. Producing at least one region of a three-dimensional component with a locally defined energy input. The detector array is arranged and designed such that speckle arising in/on the surface irradiated by the laser radiation source can be detected in a spatially resolved manner. The speckle signals are sensed in a spatially resolved manner using the detector array can be fed to an electronic evaluation and control circuit which is connected to an electronic open- and closed-loop control device designed to influence the production process. Thermal speckle excitation is achieved using a separate energy beam or an energy beam with which the energy input takes place locally in a defined manner on the material in powder or past form for three-dimensional additive manufacturing.

Inventors:
Bentoyus Beatrice
Sikarova Urana
relig mic
Application Number:
JP2020538902A
Publication Date:
October 25, 2022
Filing Date:
January 11, 2019
Export Citation:
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Assignee:
Fraunhofer-Gezel Shaft Tour Fairdelung der Angewandten Forsung A. Fau.
International Classes:
B29C64/393; B22F10/20; B22F10/31; B22F10/85; B22F12/41; B22F12/45; B22F12/47; B22F12/50; B22F12/60; B22F12/90; B29C64/135; B29C64/153; B29C64/165; B29C64/188; B29C64/20; B29C64/205; B29C64/268; B29C64/277; B29C64/286; B33Y10/00; B33Y30/00; B33Y50/02
Domestic Patent References:
JP6503764A
JP2020533481A
JP6504009A
Foreign References:
US20150219444
WO2017008789A1
DE102014202020A1
US20200262152
WO2017212619A1
US20200263978
US20190039302
Attorney, Agent or Firm:
Ken Ieiri