Title:
試料を調製及び収集するためのシステム及び方法
Document Type and Number:
Japanese Patent JP2011505550
Kind Code:
A
Abstract:
A system and method for preparing and collecting samples for analyte testing. The system can include a sample preparation system and a sample collection system coupled to the sample preparation system. The sample preparation system can include at least one of a deformable self-supporting receptacle comprising a reservoir and a freestanding receptacle comprising a reservoir. The reservoir can be adapted to contain a liquid composition. The sample collection system can be positioned in fluid communication with a reservoir of the sample preparation system, and can be adapted to capture an analyte of interest. The method can include providing a fluid path defined at least partially by the sample preparation system and the sample collection system, positioning the liquid composition in a reservoir of the sample preparation system, and moving at least a portion of the liquid composition in the fluid path to the sample collection system.
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Inventors:
Halberson, Kurt Jay.
Joseph, Stephen Sea. Pee.
Rajagopal, Raj
Velazquez, David Jay.
Zuk, Cynthia Dee.
Chandrapaty, Sai Raja
Siltbeg, Daniel E.
Covian, Paul Jay.
Goten, Teresa Jay.
Joseph, Stephen Sea. Pee.
Rajagopal, Raj
Velazquez, David Jay.
Zuk, Cynthia Dee.
Chandrapaty, Sai Raja
Siltbeg, Daniel E.
Covian, Paul Jay.
Goten, Teresa Jay.
Application Number:
JP2010535038A
Publication Date:
February 24, 2011
Filing Date:
November 19, 2008
Export Citation:
Assignee:
3M INNOVATIVE PROPERTIES COMPANY
International Classes:
G01N1/28; B01D39/16; B01D39/18; B01D39/20; B03C1/00; C12M1/26; C12Q1/04; G01N1/00; G01N1/04; G01N1/10; G01N1/34
Attorney, Agent or Firm:
Atsushi Aoki
Jun Tsuruta
Tetsuro Shimada
Kazuyoshi Ohira
Hirose Shigeki
Ryuichi Nishimura
Jun Tsuruta
Tetsuro Shimada
Kazuyoshi Ohira
Hirose Shigeki
Ryuichi Nishimura