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Title:
TEMPERATURE CHARACTERISTIC ADJUSTMENT DATA GENERATING METHOD
Document Type and Number:
Japanese Patent JP2011160081
Kind Code:
A
Abstract:

To provide a method for generating adjustment data of a temperature characteristic which can reduce the influence of an n-th temperature coefficient and suppress an increase in cost when adjusting the (n-1)-th temperature coefficient of a signal having a temperature characteristic represented by an n(n is an integer ≥1)-th function.

The temperature characteristic adjustment data generating method is a method which uses program processors (6 and 10) to generate data (803) for adjusting the temperature characteristic of a semiconductor device having a circuit for generating a signal having a temperature characteristic represented by the (n is an integer ≥1)-th function, and includes data generation processing which generates data for adjusting a temperature characteristic so as to make the value of the signal at temperature whose number is smaller than n+1 close to a value (601) obtained by adding a prescribed correction value to a target value about the signal.


Inventors:
TERADA TAKAHIDE
ITO TAKAYASU
ARISAKA NAOYA
Application Number:
JP2010018465A
Publication Date:
August 18, 2011
Filing Date:
January 29, 2010
Export Citation:
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Assignee:
RENESAS ELECTRONICS CORP
International Classes:
H03L1/02; H03B5/04
Attorney, Agent or Firm:
Shizuyo Tamamura



 
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