Title:
TEMPERATURE ADJUSTMENT DEVICE, TESTING DEVICE, AND TEMPERATURE ADJUSTMENT METHOD
Document Type and Number:
Japanese Patent JP2022181926
Kind Code:
A
Abstract:
To provide a temperature adjustment device that improves temperature followability with respect to load fluctuations of a test object.SOLUTION: A temperature adjustment device supplies a gas, of which temperature has been adjusted to a set temperature, to a thermostatic tank inside which a test object is provided, and collects the gas from the thermostatic tank. The temperature adjustment device comprises a base heater that heats the collected gas, a cooling coil that cools the gas heated by the base heater, and a heater for temperature adjustment that adjusts the temperature of the gas cooled by the cooling coil to the set temperature.SELECTED DRAWING: Figure 3
Inventors:
TANAKA TAKESHI
Application Number:
JP2021089158A
Publication Date:
December 08, 2022
Filing Date:
May 27, 2021
Export Citation:
Assignee:
FUJI ELECTRIC CO LTD
International Classes:
G01N17/00; F24F5/00; F24F11/64; F24F11/80; G05D23/19
Attorney, Agent or Firm:
Tadashige Ito
Tadahiko Ito
Tadahiko Ito
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