Title:
TEMPERATURE DETECTION CIRCUIT, ITS TESTING METHOD, AND SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JP2008039451
Kind Code:
A
Abstract:
To perform an operation test in a short time by varying no operation environment.
In a temperature detection circuit part 198 detecting a variation in an environmental temperature, a test circuit which tests a circuit operation of a power supply circuit and which comprises a monitor terminal 1991, a constant current supply I2 forming a current mirror with a constant current supply I1, and three switches SW1 to SW3 is built in a temperature detection part 1981 comprising a combination of the constant current supply I1 and a diode D1 having temperature dependence and obtaining a voltage Vtemp having temperature dependence as an output of the diode D1.
Inventors:
WAKABAYASHI NORITO
Application Number:
JP2006210616A
Publication Date:
February 21, 2008
Filing Date:
August 02, 2006
Export Citation:
Assignee:
SONY CORP
International Classes:
G01K7/01; G01K15/00; G01R31/28; H01L21/66
Domestic Patent References:
JPH09243467A | 1997-09-19 | |||
JP3613979B2 | 2005-01-26 | |||
JPS56128433A | 1981-10-07 |
Attorney, Agent or Firm:
Funabashi Kuninori