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Title:
TEMPERATURE DETECTION CIRCUIT
Document Type and Number:
Japanese Patent JPH0348737
Kind Code:
A
Abstract:
PURPOSE:To extract temperature information with the relative accuracy of a temperature coefficient to a bias voltage between anode+cathode with the number of diode stages by setting the bias voltage applied to both input ends of an amplifier by the diodes having the same temperature characteristic. CONSTITUTION:The 1st diode 3 is connected to a 1st power source 1 and (n) diodes are connected in series in the same direction from the cathode of the diode 3 to the anode of the (n)th doide 4. The cathode of the diode 4 is connected to the 1st input end of the amplifier 9 and to a 2nd power source 2 through a current source 7. Then, the anode of the (n+1)th diode 5 is connected to the power source 1 and (m) diode are connected in series in the same direction from the cathode of the diode 5 to the (n+m)th diode 6. The cathode of the diode 6 is connected to the 2nd input end of the amplifier 9 and the 2nd power source 2 through a current source 8. Offset of (m-n)Vac occurs between both input ends of the amplifier 9. Supposing that the temperature dependency of the voltage between the anode and the cathode per doide is DELTAVac, the offset between the input ends of the amplifier 9 varies by T(m-n)DELTAVac when the temperature varies by T. Thus, the temperature information is extracted with the relative accuracy to the bias voltage.

Inventors:
IKEUCHI TAKAO
KIMURA MADOKA
Application Number:
JP18547189A
Publication Date:
March 01, 1991
Filing Date:
July 17, 1989
Export Citation:
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Assignee:
NEC CORP
MIYAGI NIPPON DENKI KK
International Classes:
G01K7/01; G01K7/00; (IPC1-7): G01K7/00
Attorney, Agent or Firm:
Uchihara Shin



 
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