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Title:
TEMPERATURE HISTORY MEASUREMENT METHOD AND DEVICE
Document Type and Number:
Japanese Patent JP2007199014
Kind Code:
A
Abstract:

To provide a method for surely and easily measuring the history of atmospheric temperature of an electronic controller, for which the atmosphere temperature is prescribed.

A temperature sensor 20 is mounted on a substrate 51 inside the electronic controller 5 and the atmospheric temperature of the controller 5 is estimated from the substrate temperature by a CPU 9. The CPU 9 periodically acquires the measured values of the temperature sensor and writes them in a nonvolatile memory 17, when the values are predetermined temperature (i.e., 125°C) or higher. The nonvolatile memory 17 is associated with the temperature for each address, and "1" is recorded for the data of associated address, when the predetermined temperature or higher is measured. When the measured temperature exceeds the predetermined temperature, all is recorded in addresses from the corresponding temperature to the predetermined temperature. No rewriting is performed in the addresses that have been recorded once.

COPYRIGHT: (C)2007,JPO&INPIT


Inventors:
YAMADA SHIGEKI
TOMITA TSUGIO
NOTO YASUO
Application Number:
JP2006020494A
Publication Date:
August 09, 2007
Filing Date:
January 30, 2006
Export Citation:
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Assignee:
HITACHI LTD
International Classes:
G01K1/02; F02B39/16; F02D35/00; F02D45/00; G01D9/00; B60S5/00
Domestic Patent References:
JP2000236188A2000-08-29
JPH09159541A1997-06-20
JP2001304976A2001-10-31
JP2001133296A2001-05-18
JPH08128860A1996-05-21
Attorney, Agent or Firm:
Polaire Patent Business Corporation