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Patent Searching and Data


Title:
TEMPERATURE MEASURING DEVICE AND TEMPERATURE MEASURING METHOD
Document Type and Number:
Japanese Patent JP2014202528
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To measure a surface temperature of a high temperature body having a wide range of temperatures with a high temperature resolution even using imaging means narrow in dynamic range.SOLUTION: The temperature measuring device includes: imaging means 10a for array-arranging a photoelectric conversion element for detecting an intensity or an energy of light emitted from a cast piece 6; data acquisition means 12a for acquiring image data according to a plurality of different exposure times by switching exposure time of the imaging means 10a; data dividing means 12b for dividing the pixel corresponding to an array-arrangement of the image data according to the plurality of different exposure times acquired by the data acquisition means 12a into conversion ranges decided for each exposure time; temperature conversion means 12c for converting a brightness of the imaged data divided by the data dividing means 12b according to the exposure time and acquiring a temperature distribution; and temperature distribution integration means 12d for integrating the temperature distribution acquired by the temperature conversion means 12c and acquiring a surface temperature distribution of a high temperature body.

Inventors:
KOSHIHARA TAKAHIRO
SHIMAMOTO HIROYUKI
OSHIGE TAKAHIKO
FUKUDA YOSHINORI
Application Number:
JP2013076956A
Publication Date:
October 27, 2014
Filing Date:
April 02, 2013
Export Citation:
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Assignee:
JFE STEEL CORP
International Classes:
G01J5/48; B22D11/16; G01J5/00
Domestic Patent References:
JP2009008439A2009-01-15
JPS58168926A1983-10-05
JPH03197828A1991-08-29
Foreign References:
US7606484B12009-10-20
Attorney, Agent or Firm:
Hiroaki Sakai