Title:
TEMPERATURE SENSOR ABNORMALITY DETERMINATION DEVICE, TEMPERATURE SENSOR ABNORMALITY DETERMINATION METHOD, AND TEMPERATURE SENSOR ABNORMALITY DETERMINATION PROGRAM
Document Type and Number:
Japanese Patent JP2023048626
Kind Code:
A
Abstract:
To predict abnormality of a temperature sensor using measurement values of a temperature sensor.SOLUTION: A temperature sensor abnormality determination device 1 for determining abnormalities of temperature sensors A1 (A2, B1, and B2) measuring temperatures in an atmosphere of a measurement object comprises: a data accumulation unit 2 which accumulates measurement values of a plurality of latest samples every prescribed time of the temperature sensor A1; a detection unit 3 which detects whether measurement values of the temperature sensors A1 (A2, B1, and B2) accumulated in the data accumulation unit 2 follow a normal distribution; and a sensor warning determination unit 4 which determines whether the temperature sensors A1 (A2, B1, and B2) are a temperature sensor which warns an abnormality on the basis of the detection results of the detection unit 3.SELECTED DRAWING: Figure 1
Inventors:
ISHIBASHI SEIZO
Application Number:
JP2021158050A
Publication Date:
April 07, 2023
Filing Date:
September 28, 2021
Export Citation:
Assignee:
CHINO CORP
International Classes:
G01K7/00; G05B23/02
Attorney, Agent or Firm:
Nishimura Norimitsu
Noriyuki Suzuki
Noriyuki Suzuki