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Title:
TEMPERATURE SENSOR, TEMPERATURE SENSOR CALIBRATION METHOD, AND SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JP2017003457
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a temperature sensor that can measure errors of temperature sensors.SOLUTION: A voltage generation unit 110 is configured to switch a first voltage Vf having a CTAT characteristic and a second voltage ΔVf having a PTAT characteristic in response to a control bit b1. An integration circuit 120 is configured to integrate a value having an input voltage of a control bit b2 multiplied by a first coefficient α in response to the control bit b2, or integrate a value having the input voltage thereof multiplied by a second coefficient β therein. A quantizer 130 is configured to quantify an output of the integration circuit 120 to generate a bit stream bs. A pattern generator 140 is configured to generate a test signal ts having a prescribed duty ratio. A subtraction circuit 150 is configured to subtract a calibration reference voltage Vfrom an output voltage of the voltage generation unit 110 in response to the bit stream bs. In a calibration mode, the test signal ts is configured to be input to the voltage generation unit 110 and integration circuit 120 as control bits b1 and b2.SELECTED DRAWING: Figure 3

Inventors:
SAKANO YOSHIHISA
Application Number:
JP2015118304A
Publication Date:
January 05, 2017
Filing Date:
June 11, 2015
Export Citation:
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Assignee:
ROHM CO LTD
International Classes:
G01K7/01; G01K15/00
Attorney, Agent or Firm:
Sakaki Morishita
Masaki Taiki