Title:
テラヘルツ測定装置およびテラヘルツ測定装置の作動方法
Document Type and Number:
Japanese Patent JP7411648
Kind Code:
B2
Abstract:
Method of operating a measuring device comprising a Terahertz, THz, transmitter configured to emit a THz signal to an object to be measured and a THz receiver configured to receive a reflected portion of said THz signal that has been reflected by said object, wherein said THz transmitter and said THz receiver are arranged in a measuring head of said measuring device, said method comprising: varying a distance between said measuring head and said object to be measured, emitting, by means of said THz transmitter, said THz signal to said object to be measured, receiving said reflected portion of said THz signal, determining a first parameter characterizing a detected signal proportional and/or related to said received reflected portion of said THz signal.
Inventors:
Mestle Rudiger
Anklam Lars Christian
Anklam Lars Christian
Application Number:
JP2021519610A
Publication Date:
January 11, 2024
Filing Date:
May 25, 2020
Export Citation:
Assignee:
Helmut Fischer Gaem Behr Institute Institute Electronic Electronic und Mesteknik
International Classes:
G01B15/02
Domestic Patent References:
JP2015127699A | ||||
JP2007503582A | ||||
JP2019500629A |
Foreign References:
WO2018138523A1 |
Attorney, Agent or Firm:
Patent Attorney Corporation Taiyo International Patent Office
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