Title:
TERAHERTZ WAVE MEASUREMENT DEVICE
Document Type and Number:
Japanese Patent JP2016080655
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To realize a small and low-cost terahertz wave measurement device having high resolution.SOLUTION: A terahertz wave measurement device includes: generation means (210) for generating a terahertz wave by being radiated by a laser beam; detection means (220) for detecting the terahertz wave having been reflected by an object (500) or having penetrated through the object by being radiated by the laser beam; filtering means (300) disposed between the generation means and the object, or between the detection means and the object and having an opening (350) for making the terahertz wave pass through; and optical delay means (400) for adjusting the optical path length of a laser beam radiated by the detection means in accordance with the aperture of the opening.SELECTED DRAWING: Figure 1
Inventors:
TOGASHI TAKAHIRO
Application Number:
JP2014215198A
Publication Date:
May 16, 2016
Filing Date:
October 22, 2014
Export Citation:
Assignee:
PIONEER ELECTRONIC CORP
International Classes:
G01N21/3586; H01S1/02
Attorney, Agent or Firm:
Tatsuo Egami
Satoshi Nakamura
Satoshi Nakamura