PURPOSE: To make it possible to advantageously perform a test by a simplified mechanism, by providing a partition means and a mount means.

CONSTITUTION: Shutter apparatuses 16, 17 and a mount member 24 are provided. When the high temp. testing of an object 27 to be tested is performed, the apparatus 16 is opened to allow the object 27 to face to a high temp. chamber 28. At this time, the apparatus 17 is closed to reduce the movement of quantity of heat between a low temp. side chamber 29 and the high temp. side chamber 28 as little as possible. Next, when the object 27 is indented to be tested in the side of the low temp. side chamber 29, the apparatus 17 is opened and the member 24 is displaced at an angle of 180° to the direction shown by an arrow B1 and B2 to allow the object 27 to face to the low temp. side chamber 29. Next, the apparatus 16 is closed. By this method, a low temp. test can be performed with respect to the object 27 in the low temp. side chamber 29. At this time, the closed apparatus 16 reduces the movement of quantity of heat between the high temp. side chamber 28 and the low temp. side chamber 29 as little as possible.