To conduct a series of tests in a short time.

This device is provided with a setting means determining the setting of switches for the present test, the first memory means storing the setting of the switches for the next test after the present test within a series of tests, the second memory means storing the setting of switches for all of a series of tests, and a sequencer means 3 transferring the next switch setting to the setting means from the first memory means and transferring the switch setting for the test following the next test within a series of tests to the first memory means from the second memory means. The sequencer means 3 starts the transfer in response to the reception from a measuring means of a trigger signal indicating that the test signal for the next test will be applied to an electronic circuit 17 after the prescribed time elapses.