Title:
TEST DEVICE AND TEST METHOD
Document Type and Number:
Japanese Patent JP2012002577
Kind Code:
A
Abstract:
To provide a test device capable of very efficiently recording log data which show the state of device and state of test, etc., before/after the time when abnormality occurs, by effectively utilizing a limited memory capacity, and to provide a recording method of the log data of the test device.
In the test device comprising a plurality of units for executing a test program with respect to a sample while continuously monitoring the state of each unit and communication state between each of the units, the log data are recorded on a memory when at least any one of the state of each unit and the communication state between each of the units is changed in the state.
Inventors:
HANAWA YASUJIRO
Application Number:
JP2010136025A
Publication Date:
January 05, 2012
Filing Date:
June 15, 2010
Export Citation:
Assignee:
FUJITSU TELECOM NETWORKS LTD
International Classes:
G01D9/18; G01D9/00; G01D9/32
Domestic Patent References:
JP2001283366A | 2001-10-12 | |||
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JPH07200415A | 1995-08-04 | |||
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JP2007114906A | 2007-05-10 | |||
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JP2009206813A | 2009-09-10 |
Attorney, Agent or Firm:
Kazuhiro Kamata