Title:
TEST DEVICE
Document Type and Number:
Japanese Patent JP2013044656
Kind Code:
A
Abstract:
To provide a test device capable of testing a plurality of oscillators in parallel.
The test device includes: a signal output circuit 10 for outputting an output signal S with temporal frequency distribution; a first terminal 21 which when a first oscillator 101 is connected thereto, outputs the output signal S to the first oscillator 101; and a second terminal 22 which when a second oscillator 102 is connected thereto, outputs the output signal S to the second oscillator 102. A frequency distribution range of the output signal S is a range in which inherent oscillation frequencies of the first oscillator 101 and the second oscillator 102 are included.
Inventors:
WATANABE TORU
Application Number:
JP2011183051A
Publication Date:
March 04, 2013
Filing Date:
August 24, 2011
Export Citation:
Assignee:
SEIKO EPSON CORP
International Classes:
G01M99/00; G01N5/02; B81C99/00
Attorney, Agent or Firm:
Yukio Fuse
Mitsue Obuchi
Misa Nagata
Mitsue Obuchi
Misa Nagata