Title:
試験装置、ピンエレクトロニクスカード、電気機器、及びスイッチ
Document Type and Number:
Japanese Patent JP5089396
Kind Code:
B2
Abstract:
Provided is a test apparatus for testing a device under test, the test apparatus including: a pattern generating section that inputs a test pattern to the device under test; a judging section that receives an output signal of the device under test, and makes judgment concerning pass/fail of the device under test based on the output signal; an internal circuit that exchanges signals between the device under test and the pattern generating section or the judging section; a first transmission line that connects the internal circuit to the device under test; and a first switch that connects the first transmission line to a ground potential in not testing the device under test, and cuts off the first transmission line from the ground potential in testing of the device under test.
Inventors:
Toshiaki Awaji
Takashi Sekino
Masakazu Ando
Takashi Sekino
Masakazu Ando
Application Number:
JP2007539927A
Publication Date:
December 05, 2012
Filing Date:
October 06, 2006
Export Citation:
Assignee:
Advantest Corporation
International Classes:
G01R31/28; H01H61/04
Domestic Patent References:
| JPH1164436A | 1999-03-05 | |||
| JP2001035632A | 2001-02-09 | |||
| JP2000009804A | 2000-01-14 | |||
| JP2004112891A | 2004-04-08 |
Foreign References:
| WO2002061781A1 | 2002-08-08 |
Attorney, Agent or Firm:
Akihiro Ryuka