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Patent Searching and Data


Title:
試験装置及び試験方法
Document Type and Number:
Japanese Patent JP7104082
Kind Code:
B2
Abstract:
To provide a testing device that can execute far field measurement of RF characteristics and RRM characteristics at a low cost.SOLUTION: A testing device comprises: antennas for testing of a reflection type or a direct type 6 that transmit or receive radio signals to or from an antenna 110 of a DUT 100; and a measuring device 2 that measures the transmission characteristics or the reception characteristics of the DUT 100 by using the antennas for testing for the DUT 100 whose posture is changed by a posture variable mechanism 56. The measuring device includes: a signal processing unit 40 that converts the frequency of signals transmitted by the antennas for testing as radio signals or the frequency of radio signals received by the antennas for testing 6; and a switching unit 141 that switches signal paths between the signal processing unit 40 and the antennas for testing of the direct type to a signal path through which one antenna for testing of the plurality of antennas for testing of the direct type is connected with the signal processing unit.SELECTED DRAWING: Figure 7

Inventors:
Maruo Tomohiko
Hiroyuki Baba
Masafumi Kaoru
Application Number:
JP2020019004A
Publication Date:
July 20, 2022
Filing Date:
February 06, 2020
Export Citation:
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Assignee:
Anritsu Co., Ltd.
International Classes:
G01R29/10; G01R29/08; H04B17/16; H04B17/17; H04B17/29
Domestic Patent References:
JP1138056A
JP11304860A
JP2011149725A
JP2005502860A
JP2020122678A
Foreign References:
US10082530
Other References:
西澤 一史 Kazushi NISHIZAWA ほか,測定距離の変化による反射波除去放射パターン測定法を適用した反射波源位置推定法 Detecting Each Position of Residual Reflections Using a Radiation Pattern Measurement Method for Eliminating Reflections by Distance Changing Technique,電子情報通信学会論文誌 (J83-B) 第9号 THE TRANSACTIONS OF THE INSTITUTE OF ELECTRONICS,INFORMATION AND COMMUNICATION ENGINEERS B,日本,社団法人電子情報通信学会 THE INSTITUTE OF ELECTRONICS,INFORMATION AND COMMUNICATION ENGINEERS,2000年10月20日,第J83-B巻,p.1293-1302
Attorney, Agent or Firm:
Eiichiro Ariga
Ariga Gunichiro