Title:
複数の試験サイトで漏れ検出を実行する試験装置
Document Type and Number:
Japanese Patent JP5758482
Kind Code:
B2
Inventors:
Vladimir Schwartz
Boris Chernobrod
Boris Chernobrod
Application Number:
JP2013503095A
Publication Date:
August 05, 2015
Filing Date:
April 06, 2011
Export Citation:
Assignee:
Inficon GmbH
International Classes:
G01M3/20
Domestic Patent References:
| JP2005221420A | ||||
| JP1227046A |
Foreign References:
| US20080259340 | ||||
| US3416070 | ||||
| DE19853049A1 |
Other References:
V.G.Avetisov and P.Kauranen,Two-tone frequency-modulation spectroscopy for quantitative measurements of gaseous spiecies: Theoritical, numerical, and experimental investigation of line shapes,APPLIED OPTICS,米国,Optical Society of America,1996年 8月20日,Vol.30, No.24,pp.4705-4723
Attorney, Agent or Firm:
Hiroshi Yamazaki
Mitsuo Tanaka
Atsushi Maeda
Mitsuo Tanaka
Atsushi Maeda