Title:
TEST AND MEASUREMENT DEVICE AND PRESCALING METHOD
Document Type and Number:
Japanese Patent JP2017026603
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a test and measurement device capable of prescaling signals while reducing noise.SOLUTION: A test and measurement device includes an automatic frequency prescaler 200 configured to receive an input signal. A plurality of divider circuits 205 employ a plurality of division ratios such that each division ratio scales an event signal indicating events in the input signal by a predetermined integer value. A control system 210 is configured to iteratively determine an estimated signal frequency of the event signal, and automatically select a division ratio for the event signal based on the estimated signal frequency thus determined. Frequency range counters 209 are configured to count triggers in the event signal subsequent to application of the division ratio.SELECTED DRAWING: Figure 2
Inventors:
DAVID L KELLY
SMITH PATRICK A
SMITH PATRICK A
Application Number:
JP2016130370A
Publication Date:
February 02, 2017
Filing Date:
June 30, 2016
Export Citation:
Assignee:
TEKTRONIX INC
International Classes:
G01R23/10; H03K21/00
Attorney, Agent or Firm:
Yamaguchi International Patent Office