Title:
Test measurement equipment and the signal digitization method
Document Type and Number:
Japanese Patent JP6258573
Kind Code:
B2
Abstract:
A test and measurement instrument including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signal; a plurality of harmonic mixers, each harmonic mixer configured to mix an associated split signal of the plurality of split signals with an associated harmonic signal to generate an associated mixed signal; and a plurality of digitizers, each digitizer configured to digitize a mixed signal of an associated harmonic mixer of the plurality of harmonic mixers. A first-order harmonic of at least one harmonic signal associated with the harmonic mixers is different from an effective sample rate of at least one of the digitizers.
Inventors:
Daniel Gee Nilim
Application Number:
JP2012119867A
Publication Date:
January 10, 2018
Filing Date:
May 25, 2012
Export Citation:
Assignee:
TEKTRONIX,INC.
International Classes:
H03M1/12; G01R13/20
Domestic Patent References:
| JP2009206682A | ||||
| JP9510074A | ||||
| JP2006504100A | ||||
| JP2008521014A | ||||
| JP2006308585A |
Foreign References:
| US20080231488 | ||||
| WO2004038432A2 | ||||
| US20060247870 |
Attorney, Agent or Firm:
Yamaguchi International Patent Office