Title:
TEST AND MEASUREMENT INSTRUMENT AND WAVEFORM ACQUISITION METHOD
Document Type and Number:
Japanese Patent JP2014202757
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To prevent inter-system interference while acquiring waveforms of a device under test having variation in system S-parameters.SOLUTION: An amplifier 200 receives a waveform from a device under test. A digitizer 202 digitizes the waveform. A system separation unit 300 identifies a plurality of portions of the digitized waveform with a plurality of different S-parameter characteristics, and separates the identified portions into a plurality of different waveforms. A display part 504 displays the plurality of different waveforms. The system separation unit 300 may be embodied by software being executed by a processor of a test and measurement instrument 502.
Inventors:
JOHN J PICKERD
Application Number:
JP2014078631A
Publication Date:
October 27, 2014
Filing Date:
April 07, 2014
Export Citation:
Assignee:
TEKTRONIX INC
International Classes:
G01R13/20
Domestic Patent References:
| JP2009236765A | 2009-10-15 | |||
| JP2009053032A | 2009-03-12 |
Foreign References:
| US20090192740A1 | 2009-07-30 |
Other References:
「シリアル・データ・リンク解析（SDLA）DPO/DSA70000/Bシリーズ・オシロスコープ用SLE/SLAオプション」, JPN6017011461, April 2009 (2009-04-01)
“SDLA SERIAL DATA LINK ANALYSIS PRINTABLE ONLINE HELP”, JPN6017011463, 29 July 2011 (2011-07-29), pages 1 - 8
高橋誠, 「最新のＤＤＲメモリの測定評価手法」, JPN6018003926, 2012
“SDLA SERIAL DATA LINK ANALYSIS PRINTABLE ONLINE HELP”, JPN6017011463, 29 July 2011 (2011-07-29), pages 1 - 8
高橋誠, 「最新のＤＤＲメモリの測定評価手法」, JPN6018003926, 2012
Attorney, Agent or Firm:
Patent business corporation Yamaguchi international patent firm