Title:
TEST MEASUREMENT MACHINE LEARNING DEVELOPMENT SYSTEM AND MACHINE LEARNING DEVELOPMENT SYSTEM OPERATION METHOD
Document Type and Number:
Japanese Patent JP2023055667
Kind Code:
A
Abstract:
To effectively develop a machine learning model.SOLUTION: A test measurement machine learning model development system 10 includes a user interface 18, a data port 13 for making the system 10 connectable to a data source, a memory 16 and a processor 12. The processor 12 is configured so as to execute a program that causes the processor 12 to perform processing for: displaying an application user interface in the user interface 18 to enable a user to perform a user input; setting the system 10 by using an application programming interface on the basis of the user input; receiving data from one or more data sources, and applying one or more modules of a library of a signal processing and feature extraction module to the data to generate training data; monitoring one or more machine learning models; and storing the one or more machine learning models in the memory 16.SELECTED DRAWING: Figure 1
Inventors:
MARK ANDERSON SMITH
SUNIL MAHAWAR
JOHN J PICKERD
SRIRAM K MANDYAM
SUNIL MAHAWAR
JOHN J PICKERD
SRIRAM K MANDYAM
Application Number:
JP2022156910A
Publication Date:
April 18, 2023
Filing Date:
September 29, 2022
Export Citation:
Assignee:
TEKTRONIX INC
International Classes:
G06N20/00; G06F18/213
Attorney, Agent or Firm:
Hiroshi Arafune
Yoshio Arafune
Yoshio Arafune
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