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Patent Searching and Data


Title:
TEST MEASURING DEVICE AND METHOD AND COMPUTER READABLE MEDIUM
Document Type and Number:
Japanese Patent JP2013044747
Kind Code:
A
Abstract:

To easily confirm effects of a FFT window function.

A display screen 12 of an oscilloscope is divided into a time domain display area 80 in which a time domain waveform 82 of an input signal is displayed, and a frequency domain display area 84 in which a frequency domain waveform 86 of the input signal is displayed. The input signal is correlated to a time criterion. The frequency domain waveform 86 corresponds to a selected temporal term of the time domain waveform 82. A spectrum time indicator 90 graphically indicates the temporal term, used for generating the frequency domain waveform 86, and a FFT window shape.


Inventors:
GARY J WALDO
DOBYNS KENNETH P
Application Number:
JP2012177993A
Publication Date:
March 04, 2013
Filing Date:
August 10, 2012
Export Citation:
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Assignee:
TEKTRONIX INC
International Classes:
G01R13/20; G01R23/16; G01R23/173
Domestic Patent References:
JP2007205735A2007-08-16
JP2001235489A2001-08-31
JP2007199030A2007-08-09
JP2007205736A2007-08-16
Foreign References:
US20130044134A12013-02-21
Other References:
平坂文男, 実験音声学のための音声分析, JPN6016014673, 31 March 2009 (2009-03-31), pages 118, ISSN: 0003525459
小野浩司, シミュレーティングで学ぶアナログ&ディジタルフィルタ入門, JPN6016014675, 25 December 1999 (1999-12-25), pages 188 - 190, ISSN: 0003525460
戸田浩: "「高品質化への解析&加工プログラミング」", C MAGAZINE, vol. 第9巻第10号(通巻97号), JPN6016014677, 1 October 1997 (1997-10-01), pages 35 - 37, ISSN: 0003525461
Attorney, Agent or Firm:
Yamaguchi International Patent Office