Title:
試験測定装置及びトリガ方法
Document Type and Number:
Japanese Patent JP6815589
Kind Code:
B2
Abstract:
A test and measurement instrument, including an input configured to receive a signal-under-test, a user input configured to accept a first trigger event and a second trigger event from a user, a first trigger decoder configured to trigger on an occurrence of the first trigger event and generate a first trigger signal, a second trigger decoder configured to trigger on an occurrence of the second trigger event occurring after the first trigger event and generate a second trigger signal, and an acquisition system configured to acquire the signal-under-test in response to the first trigger signal and store the acquired signal-under-test based on whether the second trigger signal validates or invalidates the first trigger signal.
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JPS60114770 | MULTITRACE OSCILLOSCOPE |
Inventors:
Daniel Gee Nilim
David El Kelly
Jed H Andrew
Michael A. Martin
Patrick A. Smith
David El Kelly
Jed H Andrew
Michael A. Martin
Patrick A. Smith
Application Number:
JP2015081816A
Publication Date:
January 20, 2021
Filing Date:
April 13, 2015
Export Citation:
Assignee:
TEKTRONIX,INC.
International Classes:
G01R13/28; G01R13/32
Domestic Patent References:
JP2009014364A | ||||
JP2012251855A | ||||
JP2007020373A | ||||
JP2007327745A | ||||
JP2021566U | ||||
JP3072269A | ||||
JP8010235B2 |
Foreign References:
US20050225310 | ||||
US20040236527 |
Attorney, Agent or Firm:
Yamaguchi International Patent Office