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Title:
試験測定装置及びトリガ方法
Document Type and Number:
Japanese Patent JP6815589
Kind Code:
B2
Abstract:
A test and measurement instrument, including an input configured to receive a signal-under-test, a user input configured to accept a first trigger event and a second trigger event from a user, a first trigger decoder configured to trigger on an occurrence of the first trigger event and generate a first trigger signal, a second trigger decoder configured to trigger on an occurrence of the second trigger event occurring after the first trigger event and generate a second trigger signal, and an acquisition system configured to acquire the signal-under-test in response to the first trigger signal and store the acquired signal-under-test based on whether the second trigger signal validates or invalidates the first trigger signal.

Inventors:
Daniel Gee Nilim
David El Kelly
Jed H Andrew
Michael A. Martin
Patrick A. Smith
Application Number:
JP2015081816A
Publication Date:
January 20, 2021
Filing Date:
April 13, 2015
Export Citation:
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Assignee:
TEKTRONIX,INC.
International Classes:
G01R13/28; G01R13/32
Domestic Patent References:
JP2009014364A
JP2012251855A
JP2007020373A
JP2007327745A
JP2021566U
JP3072269A
JP8010235B2
Foreign References:
US20050225310
US20040236527
Attorney, Agent or Firm:
Yamaguchi International Patent Office