Title:
TEST METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT
Document Type and Number:
Japanese Patent JP3518956
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To execute characteristics test of input and output in a short time, by giving synthesized sine wave signal group with different frequency and individually different amplitude to an LSI to be tested and expanding again the output for every frequency.
SOLUTION: An input signal data producing part 31 produces sine wave data with different frequencies and different amplitudes at around basic frequency within a functional characteristics. The data is put to the reverse Fourier transform and the synthetic wave data of produced time function is made an actual analog synthetic wave 33 by an arbitrary wave generator 32 and supplied to a semiconductor LSI 30 of tested circuit. The LSI 30 outputs an output wave 34 following an internal characteristics and detects digital values of sampling time intervals with a digitizer 35. This digital value is put to Fourier transform to expand again to the original sine wave frequency and to give to an output circuit 36. The output circuit 36 detects the output amplitude for every frequency and obtains the relation of the initial input signal to the amplitude. By this, characteristics test in short time becomes possible.
Inventors:
Ozaki, Kazunari
Shimabayashi, Kazuhiko
Shimabayashi, Kazuhiko
Application Number:
JP22988996A
Publication Date:
April 12, 2004
Filing Date:
August 30, 1996
Export Citation:
Assignee:
FUJITSU LTD
International Classes:
G01R31/28; G01R31/316; H03M1/10; G01R31/26; (IPC1-7): G01R31/316; G01R31/26; H03M1/10
Attorney, Agent or Firm:
土井 健二 （外１名）
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