Title:
試験方法、通信デバイス、及び試験システム
Document Type and Number:
Japanese Patent JP4388931
Kind Code:
B2
Abstract:
A testing method of a communication device according to the present invention comprises: a step for transmitting and receiving a test signal generated based on a reference clock; a step for generating an anticipated value of the test signal based on the reference clock; a step for delaying the test signal; a step for comparing the delay test signal with the anticipated value and outputting the comparison results; a step for repeatedly performing the above steps and storing the comparison results for each delay time; a step for detecting the eye opening for the test signal based on the comparison results for each delay time; and a step for determining the quality of the communication device based on the detected eye opening.
Inventors:
Daisuke Watanabe
Application Number:
JP2005512533A
Publication Date:
December 24, 2009
Filing Date:
July 30, 2004
Export Citation:
Assignee:
Advantest Corporation
International Classes:
H04L25/02; G01R31/28; G01R31/30; G01R31/3193; H04L1/24
Domestic Patent References:
| JP2000332736A | ||||
| JP4054043A | ||||
| JP1160237A | ||||
| JP1154660A | ||||
| JP2004289387A |
Attorney, Agent or Firm:
Akihiro Ryuka