Title:
テスト配列の誤り訂正方法、対応するシステム及び遺伝子のアセンブリ装置
Document Type and Number:
Japanese Patent JP5344774
Kind Code:
B2
Abstract:
The present invention provides an error correcting method of test sequence, which involves receiving test sequences, configuring high frequency short string list based on a preset high frequency threshold value, traversing each received test sequence, searching an area with the largest number of continuous high frequency short strings on each test sequence in combination with high frequency short string list, configuring whole left sequence and/or right sequence of high frequency short strings at left side and/or right side of searched area according to corresponding received test sequence and high frequency short string list, and constituting corresponding test sequence according to configured left and/or right sequence and searched area. The present invention also provides corresponding error correcting system of test sequence and gene assembly equipment.
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Inventors:
One, Jun
Yang, Fan Min
one chance
Yang, Fan Min
one chance
Application Number:
JP2011539874A
Publication Date:
November 20, 2013
Filing Date:
December 11, 2009
Export Citation:
Assignee:
BGI Tech Solutions Company Limited
International Classes:
G16B30/20; C12Q1/68
Domestic Patent References:
| JP2003530631A |
Other References:
Tammi MT,et al.,Correcting errors in shotgun sequences,Nucleic Acids Research,2003年,Vol.31,No.15,p.4663-4672
Attorney, Agent or Firm:
Hidekazu Miyoshi
Masakazu Ito
Yuko Hara
Masakazu Ito
Yuko Hara