Title:
TEST SIGNAL GENERATOR
Document Type and Number:
Japanese Patent JPS533714
Kind Code:
A
Abstract:
PURPOSE: Waveform data containg prescribed test signals are stored in a lowspeed memory temporarily and are transferred to a high-speed memory during a signal generation braking period, so that the capacity of expensive high-speed memory can be reduced as mush as possible.
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Inventors:
SAGARA YUUJI
Application Number:
JP7804676A
Publication Date:
January 13, 1978
Filing Date:
July 01, 1976
Export Citation:
Assignee:
TOKYO SHIBAURA ELECTRIC CO
International Classes:
H04N17/00; G01R31/00; H04B3/46; H04B17/00; (IPC1-7): G01R31/00; H04B3/46; H04N7/02
Next Patent: TEST SIGNAL GENERATOR