Title:
試験システム及び接続検査装置
Document Type and Number:
Japanese Patent JP6432928
Kind Code:
B2
Abstract:
A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
Inventors:
Daniel Gee Nilim
William A. Hugger Up
Burton Thi Hickman
Isla Gee Pollock
William A. Hugger Up
Burton Thi Hickman
Isla Gee Pollock
Application Number:
JP2013213901A
Publication Date:
December 05, 2018
Filing Date:
October 11, 2013
Export Citation:
Assignee:
TEKTRONIX,INC.
International Classes:
G01R31/02; G01R13/20
Domestic Patent References:
| JP2009145172A | ||||
| JP674973A | ||||
| JP8160097A |
Foreign References:
| US6064312 |
Attorney, Agent or Firm:
Yamaguchi International Patent Office