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Title:
TEST SYSTEM FOR ELECTRONIC EXCHANGE
Document Type and Number:
Japanese Patent JPH0322657
Kind Code:
A
Abstract:

PURPOSE: To attain efficient fault analysis by outputting a command from a system console when system-down is detected, giving a read request of fault information to an electronic exchange and collecting fault detailed information automatically.

CONSTITUTION: A test execution section 12 of a system console 1 at the test start requests the execution processing of a test item to an electronic exchange 2 through an input/output control section 14. When the result of test is awaited, if system-down takes place, a read request processing of common fault information is implemented immediately from a main control section 11 to a fault information collection section 13 to collect data through an input/output control section 14. The collected data is analyzed by the main control section 11 to find out a processor number, execution module and execution section having a fault. Moreover, the collected data are outputted to a designated output device such as a magnetic disk 3, a printer 4 or a flexible disk 5.


Inventors:
YAMAGUCHI NORIO
KOBAYASHI YASUO
Application Number:
JP15759189A
Publication Date:
January 31, 1991
Filing Date:
June 19, 1989
Export Citation:
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Assignee:
NEC CORP
International Classes:
G06F11/34; G06F11/22; H04M3/08; H04M3/22; (IPC1-7): G06F11/22; G06F11/34; H04M3/08; H04M3/22
Attorney, Agent or Firm:
Uchihara Shin