To provide a test system for analogue/digital hybrid ICs capable of and operating an analogue test system and a logic test system by accurate synchronization.

The test system for the analogue/digital hybrid ICs is provided with the logic test system and the analogue test system and controls both of them by a main program. The main program comprises a pattern generating program used for a logic test, and a description for generating a control signal for the analogue test system is added to part of the pattern generating program.