Title:
試験システム、試験方法およびプログラム
Document Type and Number:
Japanese Patent JP7436921
Kind Code:
B2
Abstract:
An API testing device 2 comprises: a testing unit 21 that performs testing of an API adapter used in a wholesale service device 4 and stores parameter data that includes parameters applied to the wholesale service device 4 during testing; and an instruction unit 22 that provides, to the command line testing device 1, parameter data P and testing script data T that tests a command line interface provided by the wholesale service device 4, and issues a testing instruction. The command line testing device 1 comprises: an acquisition unit 11 that obtains the testing script data T and the parameter data P, from the API testing device 2; and a command line testing unit 12 that sets the parameters and executes the command line, in accordance with the testing script data T, and sends execution results to the instruction unit 22.
Inventors:
Sho Kanamaru
Yuki Ikeya
Kensuke Takahashi
Takeshi Toyoshima
Yuki Ikeya
Kensuke Takahashi
Takeshi Toyoshima
Application Number:
JP2022541400A
Publication Date:
February 22, 2024
Filing Date:
August 05, 2020
Export Citation:
Assignee:
Nippon Telegraph and Telephone Corporation
International Classes:
G06F11/36
Foreign References:
| US8745641 | ||||
| US20140075242 |
Attorney, Agent or Firm:
Hidekazu Miyoshi
Rie Kudo
Rie Kudo