PURPOSE: To enable test on the same testing conditions without altering a program for testing with respect to a semiconductor integrated circuit to be tested different in a terminal array by switching a point to which a control signal and a data are transmitted.

CONSTITUTION: A test for a semiconductor integrated circuit IC2 to be tested different in a terminal array is performed by altering combination in connection of a test signal generation circuit I, an output judging circuit O and a power source circuit V to a connection with respect to input and output terminals 2-1-2-3 and 2-4-2-6. At this point, a point to which a control signal and a data from a control circuit 3 is switched to a circuit with connections 1-11-1-16 after the alteration of the combination. Thus, the same test conditions can be applied for the IC2 different in the terminal array without altering a corresponding program for testing.