Title:
TESTING APPARATUS AND TESTING PROCESS
Document Type and Number:
Japanese Patent JP2006184158
Kind Code:
A
Abstract:
To provide a testing apparatus and a testing process capable of performing tests suitable for operating environments of a buffer.
Since the testing apparatus provided with a shaker 1 for vibrating one end (a) of the buffer D for measuring a damping force generated by the buffer D is provided with both a load means 10 for providing a load for the other end (b) of the buffer D and a load detection means 30 for detecting a load acting on the buffer D, the other end side of the buffer D becomes a free end and can be vibrated, and it is thereby possible to perform tests suitable for operating environments of the buffer D.
Inventors:
Abe, Chikatoshi
Application Number:
JP2004000379192
Publication Date:
July 13, 2006
Filing Date:
December 28, 2004
Export Citation:
Assignee:
KAYABA IND CO LTD
International Classes:
G01M7/02; G01M7/00
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