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Patent Searching and Data


Title:
TESTING CIRCUIT FOR IC
Document Type and Number:
Japanese Patent JPH11101853
Kind Code:
A
Abstract:

To provide the testing circuit of an IC capable of incorporating the testing circuit in the IC without increasing the number of external terminals.

This testing circuit 11 of the IC incorporated in the IC 1 for generating and outputting test signals R1 and R2 for testing a normal circuit 40 inside shares the external terminal 41 of the normal circuit 40 provided with the external terminal 41 and operated in a prescribed voltage inside the normal circuit 40 as an input terminal for inputting signals for the ON/OFF of its own testing operation and is operated only when a voltage out of the prescribed range is inputted from the input terminal.


Inventors:
KITADOU MASAHARU
ITO HISAHARU
KIDERA KAZUNORI
SAKAMOTO HIDEO
Application Number:
JP26003497A
Publication Date:
April 13, 1999
Filing Date:
September 25, 1997
Export Citation:
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Assignee:
MATSUSHITA ELECTRIC WORKS LTD
International Classes:
G01R31/3185; G01R31/28; (IPC1-7): G01R31/28; G01R31/3185
Attorney, Agent or Firm:
Shigeji Sato (1 person outside)