Title:
TESTING DEVICE FOR INFRARED IMAGE PICKUP DEVICE
Document Type and Number:
Japanese Patent JPH0552647
Kind Code:
A
Abstract:
PURPOSE:To set spatial frequency accurately in a testing device to carry out a performance evaluation test expressed by a spatial frequency function for an infrared image pickup device by using a reference heat pattern having prescribed number of slits. CONSTITUTION:A testing device is constituted in such a way that image pickup signals of a reference heat pattern 2 are accumulated temporarily in a line memory 4, and white signals to show a high temperature part in this line memory 4 are counted as slit passing signals by means of a counter 6, and by comparing them with preset reference spatial frequency data, conformity or nonconformity is detected, so that a distance between an infrared image pickup device 3 and the heat pattern 2 can be adjusted. The heat pattern 2 displayed on the infrared image pickup device 3 can be set accurately in specified spatial frequency.
Inventors:
MATSUDA YUICHI
Application Number:
JP24267591A
Publication Date:
March 02, 1993
Filing Date:
August 27, 1991
Export Citation:
Assignee:
FUJITSU LTD
International Classes:
G01J1/00; G01J1/02; G01J5/00; H04N5/33; H04N17/00; (IPC1-7): G01J1/00; G01J1/02; G01J5/00; H04N5/33; H04N17/00
Attorney, Agent or Firm:
Shuji Moizumi
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