Title:
TESTING DEVICE AND TESTING METHOD OF DIGITAL MODULATION SIGNAL
Document Type and Number:
Japanese Patent JP2014016196
Kind Code:
A
Abstract:
To provide a testing device capable of testing a digital modulation signal.
A DUT 1 subjects a carrier signal to digital modulation in accordance with a symbol string to generate a test object signal S1. A multi-phase clock generator 10 generates a first strobe signal STRB1 synchronized with the carrier signal and having an edge in a phase of 0° and/or 180° of the carrier signal and a second strobe signal STRB2 having an edge in a phase of 270° and/or 90° of the carrier signal. An evaluator 30 evaluates the test object signal S1 on the basis of a level of the test object signal S1 at timing of the edge of the first strobe signal STRB1 and a level of the test object signal S1 at timing of the edge of the second strobe signal STRB2.
Inventors:
ICHIYAMA KIYOTAKA
ISHIDA MASAHIRO
ISHIDA MASAHIRO
Application Number:
JP2012152795A
Publication Date:
January 30, 2014
Filing Date:
July 06, 2012
Export Citation:
Assignee:
ADVANTEST CORP
International Classes:
G01R31/316; G01R31/28
Attorney, Agent or Firm:
Sakaki Morishita
Yusuke Murata
Tomoyuki Miki
Masaki Taiki
Yusuke Murata
Tomoyuki Miki
Masaki Taiki
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